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| 短波长X射线衍射无损测定铝板内部残余应力 |
| Non-destructive Measurng Internal Residual Stress in Aluminum Alloy Plates Using Short-wavelength Characteristic X-ray Diffraction |
| Received:December 30, 2010 Revised:March 10, 2011 |
| DOI： |
| 中文关键词: 内部残余应力 铝合金板 短波长特征X射线 衍射 |
| 英文关键词: short-wavelength characteristic X-ray diffraction internal stress aluminum alloy plate |
| 基金项目:国家高技术研究发展计划（863项目2009AA03Z539） |
| Author Name | Affiliation | | ZHENG Lin | No.59 Institute of China Ordnance Industry, Chongqing 400039, China | | ZHANG Jin | Beijing Key Laboratory for Corrosion, Erosion and Surface Technology, University of Science and Technology Beijing, Beijing 100083, China | | HE Chang-guang | No.59 Institute of China Ordnance Industry, Chongqing 400039, China | | PENG Zhen-kun | No.59 Institute of China Ordnance Industry, Chongqing 400039, China | | GAO Zheng-huan | Beijing Key Laboratory for Corrosion, Erosion and Surface Technology, University of Science and Technology Beijing, Beijing 100083, China | | MOU Jian-lei | Beijing Key Laboratory for Corrosion, Erosion and Surface Technology, University of Science and Technology Beijing, Beijing 100083, China |
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| 中文摘要: |
| 利用重金属靶短波长特征X射线WKα-1对轻质材料的强穿透性，自主研发了1台用于工件内部晶体物质衍射分析的短波长X射线衍射仪(SWXRD)。介绍了短波长X射线衍射仪无损测定工件内部应力的原理和方法，在国内首次无损地测定了30 mm厚7075铝合金淬火板内部残余应力及其分布，并与中子衍射和高能同步辐射的短波长X射线衍射测定内部应力进行了比较分析，表明该新方法具有设备体积小，投资少，使用维护方便等优势。 |
| 英文摘要: |
| Heavy metal target short-wavelength characteristic X-rays 〖JP2〗(such as WKα-1 of wavelength 0.0209 nm) is capable of penetrating the light materials strongly. An apparatus used to analysis within the interior of crystal materials diffraction by short-wavelength X-ray diffraction had been studied and developed independently. This article described the short-wavelength X-ray diffractometer (SWXRD) working principles and methods of non-destructive measuring internal stress of materials. The distribution of internal residual stress in 7075-T6 aluminum alloy plate with thickness of 30 mm had been determined for the first time at home by non-destructive manner. The internal stress measuring method by SWXRD had been compared with that of neutron diffraction and short-wavelength X-ray diffraction by high-energy synchrotron radiation. The results show that the new method has advantages of small size, low investment and easy maintenance in equipment. The direction for future effort is pointed out. |
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