文章摘要
郑林,张津,何长光,等.短波长X射线衍射无损测定铝板内部残余应力[J].精密成形工程,2011,3(2):25-30.
ZHENG Lin,ZHANG Jin,HE Chang-guang,et al.Non-destructive Measurng Internal Residual Stress in Aluminum Alloy Plates Using Short-wavelength Characteristic X-ray Diffraction[J].Journal of Netshape Forming Engineering,2011,3(2):25-30.
短波长X射线衍射无损测定铝板内部残余应力
Non-destructive Measurng Internal Residual Stress in Aluminum Alloy Plates Using Short-wavelength Characteristic X-ray Diffraction
投稿时间:2010-12-30  修订日期:2011-03-10
DOI:
中文关键词: 内部残余应力  铝合金板  短波长特征X射线  衍射
英文关键词: short-wavelength characteristic X-ray  diffraction  internal stress  aluminum alloy plate
基金项目:国家高技术研究发展计划(863项目2009AA03Z539)
作者单位
郑林 中国兵器工业第五九研究所 重庆 400039 
张津 北京科技大学 腐蚀、磨蚀及表面技术重点实验室 北京 100083 
何长光 中国兵器工业第五九研究所 重庆 400039 
彭正坤 中国兵器工业第五九研究所 重庆 400039 
高振桓 北京科技大学 腐蚀、磨蚀及表面技术重点实验室 北京 100083 
牟建雷 北京科技大学 腐蚀、磨蚀及表面技术重点实验室 北京 100083 
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中文摘要:
      利用重金属靶短波长特征X射线WKα-1对轻质材料的强穿透性,自主研发了1台用于工件内部晶体物质衍射分析的短波长X射线衍射仪(SWXRD)。介绍了短波长X射线衍射仪无损测定工件内部应力的原理和方法,在国内首次无损地测定了30 mm厚7075铝合金淬火板内部残余应力及其分布,并与中子衍射和高能同步辐射的短波长X射线衍射测定内部应力进行了比较分析,表明该新方法具有设备体积小,投资少,使用维护方便等优势。
英文摘要:
      Heavy metal target short-wavelength characteristic X-rays 〖JP2〗(such as WKα-1 of wavelength 0.0209 nm) is capable of penetrating the light materials strongly. An apparatus used to analysis within the interior of crystal materials diffraction by short-wavelength X-ray diffraction had been studied and developed independently. This article described the short-wavelength X-ray diffractometer (SWXRD) working principles and methods of non-destructive measuring internal stress of materials. The distribution of internal residual stress in 7075-T6 aluminum alloy plate with thickness of 30 mm had been determined for the first time at home by non-destructive manner. The internal stress measuring method by SWXRD had been compared with that of neutron diffraction and short-wavelength X-ray diffraction by high-energy synchrotron radiation. The results show that the new method has advantages of small size, low investment and easy maintenance in equipment. The direction for future effort is pointed out.
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